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11021


Chroma 11021 LCR Meter
Chroma 11021 LCR Meter
11021

The Chroma 11021/11021-L LCR Meter are the most cost-effective digital LCR Meter, provides 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS-232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.

The Chroma 11021/11021-L use lower harmonicdistortion phase-detection technology to reduce affection of measurement accuracy caused by hysteresis distortion in magnetic component or high dielectric-coefficient capacitor measurement, which is not provided in general low-end LCR Meters.

The 11021-L is the ideal selection for high frequency coil, core, choke, and etc. passive components incoming/outgoing material quality inspect and automatic production.

Key Features

  • Test frequencies:
    100Hz, 120Hz, 1kHz and 10kHz (9.6kHz) (11021)
    1kHz, 10kHz, 40kHz, 50kHz (11021-L)
  • Basic accuracy: 0.1% (11021), 0.2% (11021-L)
  • 0.1mΩ~99.99 MΩ measurement range, 4 1/2 digits resolution
  • Lower harmonic-distortion affection
  • Fast measurement speed (75ms)
  • Standard RS-232 interface
  • Optional GPIB & Handler interface
  • Programmable trigger delay time is convenient for measurement timing adjustment in automatic production
  • Bin-sorting function
  • Comparator and pass/fail alarming beeper function
  • Text mode 40x4 matrixes LCD display
  • Friendly user interface
  • Open/short zeroing
  • On-line fireware refreshable (via RS-232)
  • Input protection (1 Joule)

Bin-sorting Function

The 11021/11021-L provides 8-bins sorting function with bin count statistics. It is very convenient for magnetic core sorting or capacitor sorting. And the bin count statistics can be used to analysis distribution of tested results or production quality

HI/GO/LO Comparator

The 11021/11021-L has a comparator function to judge HI/GO/LOW of capacitance measured results, and to judge GO/NG of D factor. And an alarming beeper for total GO/NG judge.

Trigger Delay Time

For large capacitance measurement in automatic production, a RC (meter output resistance and unknown capacitance ) delay time for test signal transient is necessary. The 11021/11021-L provides trigger delay time for it, and is convenient for automatic equipment timing adjustment.

Input Protection

Un-discharged device (generally, a capacitor) under test is the most general reason causes destroy on a LCR Meter. The 11021/11021-L using an excellent input protection circuit to prevent it from this kind of damage.

Open/Short Zeroing

General low-end LCR meter just provides zero offset to substrate stay capacitance, residual resistance or residual inductance only for C, R, L measurement which can not accurately measure Q (quality factor) for L, R measurement and D (dissipation factor) for C measurement. The 11021/11021-L provides full open/short circuit zeroing function.


Basic Performance

Parameters / Characteristics Specifications
11021 11021-L
Measurement Parameter Primary Display L, C, R, |Z|
Secondary Display Q, D, ESR, Xs, θ
Test Signal Information Test Level 0.25V / 1V , ±(10% + 3 mV) 50mV/ 1V, ±10%+3mV
Test Frequency 100Hz, 120Hz, 1kHz, 10kHz (9.6kHz) 1kHz, 10kHz, 40kHz, 50kHz
Frequency Accuracy ±0.25% ±0.02%
Output Impedance (Typical) Varies as range resistors 25, 100, 1k, 10k, 100k
Measurement Display Range Primary Parameter L: 0.01µH ~ 9.999kH, C: 0.01pF ~ 99.99mF, R,lZl: 0.1m. ~ 99.99MΩ 
Secondary Parameter Q: 0.1 ~ 9999.9, D: 0.0001 ~ 9999.9, θ: -180.00°~ +180.00° 
Basic Accuracy ±0.1% ±0.2%
Measurement Time (1kHz) Fast Freq = 1k/10kHz : 75ms
Freq = 100/120Hz: 85ms
Freq = 1kHz/10kHz : 75ms
Freq = 40kHz : 105ms
Freq = 50kHz : 90ms
Medium 145ms Freq.=1kHz/10kHz 145ms
Freq.=40kHz 185ms
Freq.=50kHz 150ms
Slow 325ms Freq.=1kHz/10kHz 325ms
Freq.=40kHz 415ms
Freq.=50kHz 400ms
Trigger Internal, Manual, External, BUS  
Display L, C, R, |Z|, Q, D, R, θ 40 x 4 (Character Module) LCD Display
Function Correction Open/Short zeroing
Equivalent Circuit Mode Series, Parallel
Interface & Input/Output Interface RS-232 (Standard), Handler & GPIB (Optional)
Output Signal Bin-sorting & HI/GO/LOW judge
Comparator Upper/Lower limits in value
Bin Sorting 8 bin limits in %
Trigger Delay 0 ~ 9999mS

Options

Options Descriptions
Hardware Options 11021 LCR Meter 1kHz
11021 LCR Meter 10kHz
11021-L LCR Meter
A110104 SMD Test Cable #17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110232 4 BNC Test Cable with Clip#18
A110234 High Frequency Test Cable
A110235 GPIB & Handler Interface
A110236 19" Rack Mounting Kit
A110242 Battery ESR Test Kit
A133004 SMD Test Box
A165009 4 BNC Test Cable with Probe


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110225


Chroma 110225 LCR Meter Chroma 110225 LCR Meter Chroma 110225 LCR Meter
Chroma 110225 LCR Meter
Chroma 110225 LCR Meter
Chroma 110225 LCR Meter
110225

The Chroma 11022 and 11025 LCR Meters are passive component testers that give you the most cost effective alternative equivalent to other high priced meters. They are designed for the demanding applications of production test, incoming inspection, component design and evaluation. Programmable test signal level settings are from 10mV to 1V in steps of 10mV, and the VM/IM signal level monitor functions allow you to evaluate your devices at the level you specify. Ten test frequencies of 50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, and 100kHz, can be used to evaluate passive components and transformers/ LF coils.

Other low cost LCR meters on the market have shortcomings when used for low impedance component evaluations, such as the large capacitance of electrolytic capacitors and low inductance of coils. As the 11022/11025 are equipped with high resolution (0.01mΩ) in low impedance, and high accuracy (0.3%) untill 100mΩ range, they can be used to evaluate low impedance components to meet measurement requirements.

The 11025 LCR Meter can also measure DC resistance, turn ratio and mutual inductance of transformers. It is suitable for pulse transformer or LF coil evaluation. Chroma's Transformer Test Fixture used with the 11025, can measure both the primary and the secondary parameters automatically by changing the internal relays in the 11025. With this, there is no need to change the connections required for measuring transformer parameters. With an adjustable internal DC bias current source up to 200mA as a standard function, the 11025 is the right tool for inductance inspection of telecom transformers and small power chokes under DC bias current.

The 11022/11025 LCR Meters provide a powerful combination of features designed to maximize productivity in all testing environments. Measurement speed in the SHORT integration time mode is 15mS(≥100Hz). Handler interface, Pin-out, GPIB Interface, and IEEE 488 commands are compatible with 4263B.

Finally, the 11022/11025 have a built in comparator, 8 bin sorting, trigger delay functions, and handler interface trigger functions, making system integration easy, and improving measurement throughput as well as reliability.

Key Features

  • 0.1% basic accuracy
  • Transformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance
  • 0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies
  • 21ms measurement time (≥100Hz)
  • Agilent 4263B LCR Meter commands compatible
  • 4 different output resistance modes selectable for non-linear inductor and capacitor measuring
  • High resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ range
  • Adjustable DC bias current up to 200mA (constant 25Ω) (11025)
  • 1320 Bias Current Source directly control capability
  • 0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)
  • Dual frequency function (11022 option) for automatic production
  • BIAS comparator function
  • Comparator function and 8/99 bin-sorting function
  • Pass/fail judge result for automatic production
  • Handler interface trigger edge (rising/falling) programmable
  • Test signal level monitor function
  • Standard GPIB (IEEE-488) and handler interface, option RS 232 I/F
  • Open/short zeroing, load correction
  • LabView® Driver

Basic Performance

Parameters / Characteristics Specifications
11022 11025
Test Parameter L,C, R,|Z|, Q, D, ESR, X,θ L,C, R,|Z|, Q, D, ESR, X,θ
DCR4, M, Turns Ratio, L2, DCR2
Test Signal Test Frequency 50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz ; ±0.01%
Test Level 10 mV~1V , step 10 mV; ±(10% + 3 mV)
Output Impedance Constant 107X : 25Ω ;
Constant 320X : 100Ω ;
Constant 106X : 2Ω,for Z≥10Ω,
100mA (1V setting) for reactive load≤10Ω ;
Constant 102X : 25Ω, for Z<1Ω, 100Ω for else
DC Bias Current (Freq. ≥ 1kHz) - 50mA max. for Constant 100Ω,
200mA max for Constant 25Ω (AC level ≤ 100mV)
Measurement Display Range C (Capacitance) 0.001pF ~ 1.9999F
L, M, L2 (Inductance) 0.001µH ~ 99.99k
Z (Impedance), ESR 0.01mΩ ~99.99MΩ
Q (Quality Factor) ; D (Dissipation Factor) 0.0001 ~ 9999
θ(Phase Angle) -180.00° ~ +180.00°
Turns Ratio (Np:Ns) - 0.9~999.99
DCR - 0.01mΩ~99.99MΩ
Basic Measurement Accuracy ±0.1%
Measurement Time (Fast) 21ms
Interface & I/O Interface handler (50pin), GPIB, RS-232
Output Signal Bin-sorting & HI/GO/LOW judge
Comparator Upper/Lower limits in value
Bin Sorting 8/99 bin limits in %, ABS
Trigger Delay 0~9999ms
Display 240 x 64 dot-matrix LCD display
Function Correction Open/ Short zeroing, load correction
Averaging 1~256 programmable
Cable Leng 0m, 1m, 2m, 4m
Test Sig. Level Monitor Voltage, Current 
Equivalent Circuit mode Series, Parallel
Memory (Store/ Recall) 50 instrument setups
Trigger Internal, Manual, External, BUS

Options

Options Descriptions
Hardware Options 11022 LCR Meter
11025 LCR Meter
A110104 SMD Test Cable #17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110232 4 BNC Test Cable with Clip#18
A110234 High Frequency Test Cable
A110236 19" Rack Mounting Kit
A110239 4 Terminals SMD Electrical Capacitor Test Box (Patent)
A110242 Battery ESR Test Kit
A110244 High Capacitance Capacitor Test Fixture
A110245 Ring Core Test Fixture
A113012 Vacuum Generator for A132574
A113014 Vacuum Pump for A132574
A132574 Test Fixture for SMD power choke
A133004 SMD Test Box
A133019 BNC Test Lead, 2M (single side open)
A165009 4 BNC Test Cable with Probe


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1062A/1075


Chroma 10xx Precision LCR Meter
Chroma 10xx Precision LCR Meter

The 1062A/1075 LCR Meters are the measurement instruments for passive components. They are applicable to the automatic manufacturers for passive components in material inspection and production line. This series of LCR Meters can fully fulfill the fast and accurate requirements for automatic production. The functions of 8-level counting, pass/fail judgment, and 10 sets of internal save and recall settings meet the production line requirements for speed and quality, thus make this series of LCR Metes the best measurement instruments for material and production line inspection for passive components.

Key Features

  • Test frequency : 20Hz ~ 200kHz, 0.2% programmable test frequency (1075)
  • Test frequency : 40Hz ~ 200kHz, 30 Steps (1062A)
  • Basic accuracy : 0.1%
  • 3 different output impedance modes, measurement results are compatible with other well-know LCR meters
  • High resolution (0.01mΩ) and high accuracy 0.3% till 400mΩ range are the right tool for low inductance
  • Large capacitance, and low impedance component measuring
  • Single-function keys, clear LED display, easy to operate
  • 0.01mΩ~99.999mΩ wide measurement range with 5 digits resolution
  • Optional Handler & GPIB interface
  • 8 bin sorting and bin sum count function (1075)
  • Primary parameter: HI/GO/LO and secondary parameter: GO/NG judge result (1062A)
  • Alarm for GO/NG judge result
  • L/C/R/Z nominal value, upper limit %, lower limit %, Q/D/R/θ limit setting display (1062A)
  • 10 bins sorting and bin sum count function (1075)
  • Test signal level monitor function

Basic Performance

Parameters / Characteristics Specifications
1075 1062A
Test Signal Test Frequency 20Hz ~ 200kHz, 0.2% programmable test frequency 40Hz ~ 200kHz, 30 Steps
Measurement Range 0.01mΩ~99.999mΩ with 5 digits resolution
Basic Accuracy 0.1%

Options

Options Descriptions
Hardware Options 1062A Precision LCR Meter
1075 LCR Meter
A110104 SMD Test Cable#17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110232 4 BNC Test Cable with Clip#18
A110234 High Frequency Test Cable
A110239 4 Terminals SMD Electrical Capacitor Test Box (Patent)
A110601 GPIB/HANDLER Interface Card for Model
A133004 SMD Test Box
A165009 4 BNC Test Cable with Probe


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11020


Chroma 11020 Capacitance Meter
Chroma 11020 Capacitance Meter

The Chroma 11020 Capacitance Meter is a high-speed precision Capacitance Meter. Provides 100Hz, 120Hz, and 1kHz test frequencies. Measurement time is only 5 milliseconds in 1kHz, and less than 15 milliseconds in 100Hz and 120Hz test frequencies. Combine with 0.1% basic accuracy and standard Handler interface, enable the Chroma 11020 can be used on high speed production line for various capacitors.

Key Features

  • Test frequencies: 100Hz, 120Hz, 1kHz
  • Basic accuracy: 0.1%
  • High measurement speed: 5ms in 1kHz, 15ms in 100Hz/120Hz
  • Large LCD display (240x64 dot-matrix)
  • Wide measurement range: 0.1pF ~ 3.999F
  • Standard Handler interface
  • Comparator and pass/fail alarming beeper function
  • Setups backup function

Basic Performance

Parameters / Characteristics Specifications
11020
Test Signal Test Frequency 100Hz, 120Hz, 1kHz
Measurement Range 0.1pF ~ 3.999F
Basic Accuracy 0.1%
Measurement Speed  5ms in 1kHz, 15ms in 100Hz/120Hz
Display 240 x 64 dot-matrix LCD display

Options

Options Descriptions
Hardware Options 11020 LCR Meter
A110104 SMD Test Cable #17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110234 High Frequency Test Cable
A110236 19" Rack Mounting Kit
A110239 4 Terminals SMD Electrical Capacitor Test Box (Patent)
A110244 High Capacitance Capacitor Test Fixture
A133004 SMD Test Box


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13350


Chroma 13350 Automatic Transformer Tester
Chroma 13350 Automatic Transformer Tester
13350

Acquired from many years of marketing experiences and cumulative results, Chroma 13350 is the newest generation of Automatic Transformer Tester that not only retains the merits of old 3250 model but also has many new functions including the combination of measurement unit and scan box to reduce measurement error caused by long wire, C.T. test fixture and 80/20 channels scan box support, USB interface for test conditions back-up, LAN communication interface, separate setting of test frequency/voltage/speed, Fail Lock function and Auto Test. It solves the performance and quality problems as well as human errors occurred on production line for the transformer industry today.

For instance: To reduce human errors on production line, the 13350 Fail Lock function is able to lock the defect DUT (Device Under Test) when the test is done to prevent it from flowing out accidently. In order to cut down the time for placement, the 13350 Auto Test function can conduct test directly without pressing the trigger key. In addition, the 13350 adopts the design of dual CPU to increase the test speed by processing the measurement and display units simultaneously.

The compensation function of 13350 can do OPEN/SHORT for individual channel to solve the errors due to different layout on various fixtures.

13350 provides 20Hz-200kHz test frequency and scan test items to cover low voltage test parameters for various transformers including Inductance (L), Leakage (Lk) , Turn-Ratio, DC Resistance (DCR), Impedance (Z), Stray Capacity (C), Quality Factor (Q), Equivalent Series Resistance (ESR), Pin Short (PS), Winding Phase (PH) and Balance.


13350

Key Functions

  • Test frequency 20Hz ~ 200kHz
  • Turn Ratio, Phase, L, Q, Lk, ACR, DCR, Cp,Pin short, Balance
  • Basic accuracy : 0.1%
  • Three different output impedance modes
  • Scan unit/box including :
    • 20ch scan test unit
    • 80ch* scan box
    • C.T.* test fixture

Key Features

  • Compensation for individual channel
  • *Combine measurement unit with scanbox to reduce measurement errors
  • *USB storage interface
  • *10-100 LAN/ USB-H interface (option)
  • *Built-in programmable 100mA bias current (RJ-45)
  • *Test frequency, voltage and speed set separately
  • *Fail Lock function
  • *Auto Test function
  • *Equipped with external standard test on 20ch scan test unit
  • *Reduce the short-circuit loss in secondary side for leakage (Lk) test (A133502 20ch scan unit)
  • *Short-circuit pin selectable for every test item
  • *Multiple language: English & Simplified Chinese
  • *RS232 interface compatible SCPI commands

* New features compared to Chroma 3250 Series

Applicable Test Options for Selection A133502 20 Channels Scan Box

13350 uses split screen that allows the measurement unit to integrate the 20 channels scan box without using any connecting wires to reduce measurement errors. Furthermore, the 20 channels scan box has external standard test function that can perform verification test directly without any act of disassembly.

A133505 80 Channels Scan Box

13350 along with 80 channels scan box can mainly offer three different applications:

  1. RJ-45 & LAN Filter test solution that can test up to 80 pins one time.
  2. Transformer automation solution that can place 4 transformers on one carrier for scan test simultaneously.
  3. Island-type production line planning that provides a time division multiplexing module to increase the equipment utilization rate.

A133506 C.T. (Current Transformer) Test Fixture

When the 13350 works with A133506 C.T. Test Fixture, it can measure the turns, inductance and DC resistance easily and rapidly by putting in the C.T. directly.


Basic Performance

Parameters / Characteristics Specifications
11022
Main Function Transformer Scanning Test
Test Parameter Transformer Scanning Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short
Test Signal Test Level Turn 10mV~10V, ±10% 10mV/step
Others 10mV~2V, ±10% 10mV/step
Test Frequency Turn 20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution: 0.01Hz
Others 20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution : 0.001Hz (<1kHz)
Output Impedance Turn 10Ω, when level≤2V / 50Ω, when level > 2V
Others Constant = OFF : Varies as range resistors ;
Constant = 320X : 100Ω ±5% ;
Constant = 107X : 25Ω ±5%
Constant=106X : 100mA ±5% (1V setting); for inductive load less than 10Ω,10Ω±10%, for impedance ≥10Ω
Measurement Display Range L, LK 0.00001µH~9999.99H
C 0.001pF~999.999mF
Q, D 0.00001~99999
Z, X, R 0.0001Ω~999.999MΩ
θ -90.00°~ +90.00° 
DCR 0.01mΩ~99.999MΩ 
Turn,Ratio 0.01~99999.99 turns (Secondary voltage less than 100 Vrms)
Ratio (dB) -39.99dB~+99.99dB (secondary voltage less than 100 Vrms)
Pin-Short 11 pairs, between pin to pin 
Basic Accuracy L, LK, C, Z, X, Y, R, DCR ±0.1% (1kHz if AC parameter)
DCR ±0.5%
θ ±0.04°(1kHz)
Turn, Ratio (dB) ±0.5% (1kHz)
Measurement Speed (Fast) L, LK, C, Z, X, Y, R, Q, D,θ 50 meas./sec.
DCR 12 meas./sec.
Turn, Ratio (dB) 10 meas./sec.
Judge Transformer Scanning PASS/FAIL judge of all test parameters output from Handler interface, 100 bin sorting for Lk
Memory 15 instrument setups, expansion is possible via memory card
Trigger Internal, Manual, External
Display Color 640x480 LCD panel
Equivalent Circuit Mode Series, Parallel
Correction Function Open/Short Zeroing, Load correction

Options

Options Descriptions
Hardware Options 13350D Automatic Transformer Tester - Display Unit
13350M-200k Automatic Transformer Tester - Measurement Unit
A133502 20CH Scanning Box
A133505 80CH Scanning Box
A133506 CT Test Unit
A133507 Connecting Conversion Unit (I/F of 80CH scan box / provide I/O control interface/1320 DC bias cable link /BNC terminals)
A133509 GPIB Interface
A133510 LAN & USB-H Interface


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3250/3252/3302


Chroma 3xxx Transformer Test System / Component Analyzer
Chroma 3xxx Transformer Test System / Component Analyzer
a132501

The Chroma 3250/3252/3302 Transformer Test System are the precision test systems, designed for transformer production line or incoming/ outgoing inspection in quality control process, with high stability and high reliability.

The 3250/3252 provide 20Hz-200kHz tes t frequencies, and 3302 provides 20Hz-1MHz test frequencies. In addition to transformer scanning test function, the 3252/3302 have LCR Meter function. In test items, The 3250/3252/3302 cover most of transformer's low-voltage test parameters which include primary test parameters as Inductance, Leakage Inductance, Turns-Ratio, DC resistance, Impedance, and Capacitance (between windings) etc.; secondary test parameters as Quality Factor and ESR etc.; and pin-short test function. High-speed digital sampling measurement technology combined with scanning test fixture (A132501) design, improve low-efficiency transformer inspection to be more accurate and faster.

The 3250/3252/3302 even provide several output impedance selection to solve inductance measurement error problem caused by different test current caused by different output impedance provided by different LCR Meters. And, equivalent turns-ratio calculated from measured inductance of windings is also provided to improve turnsratio measurement error problem caused by large leakage magnetic flux in transformer with low permeability magnetic core.

In addition to transformer scanning test function, the 3252/3302 have LCR Meter function, can be used in component incoming/outgoing inspection, analysis and automatic production line.

Key Features

  • Test frequency: 20Hz~200kHz/1MHz, 0.02% accuracy
  • Basic accuracy: 0.1%
  • Different output impedance modes, measurement results are compatible with other well-known LCR meters
  • Enhanced Turn Ratio measurement accuracy for low permeability core
  • Fast Inductance/ Turn Ratio measurement speed up to 80 meas./sec
  • Fast DCR measurement speed up to 50 meas./sec
  • Graphical and tabular display of swept frequency, voltage current and bias current measurements (3252/3302)
  • Build-in 8mA bias for RJ45 transmission transformer saturation condition (option)
  • Leakage inductance 100 bin sorting and balance of leakage inductance for TV inverter transformer
  • ALC (Auto Level Compensation) function for MLCC measurement (3252/3302)
  • Test fixture residual capacitance compensation for transformer inductance measurement
  • 1320 Bias Current Source directly control capability (3252/3302)
  • 320x240 dot-matrix LCD display
  • Support versatile standard and custom-design test jigs
  • Four-terminal test for accurate, stable DCR, inductance and turn ratio measurements
  • Built-in comparator; 10 bin sorting with counter capability (3252/3302)
  • Lk standard value with Lx measure value
  • 4M SRAM memory card, for setup back-up between units
  • Standard RS-232, Handler, and Printer Interface, option GPIB Interface for LCR function only
  • 15 internal instrument setups for store/recall capability

Basic Performance

Parameters / Characteristics Specifications
3250 3252 3302
Main Function Transformer Scanning Test Transformer Scanning Test + LCR Meter
Test Parameter Transformer Scanning Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short
LCR METER - L, C, R, |Z|, Y, DCR, Q, D, R, X,θ, Ratio (dB)
Test Signal Test Level Turn 10mV~10V, ±10% 10mV/step
Others 10mV~2V, ±10% 10mV/step
Test Frequency Turn 1kHz~200kHz, ± (0.1% + 0.01Hz), Resolution: 0.01 Hz 1kHz~1MHz, ±(0.1%+0.01Hz), Resolution : 0.01 Hz
Others 20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution : 0.001 Hz (<1kHz) 20Hz~1MHz, ±(0.1%+0.01Hz), Resolution 0.001 Hz (<1kHz)
Output Impedance Display Turn 10Ω, when level≤2V / 50Ω, when level > 2V
Others Constant = OFF : Varies as range resistors ;
Constant = 320X : 100Ω ±5% ;
Constant = 107X : 25Ω ±5%
Constant=106X : 100mA ±5% (1V setting); for inductive load less than 10Ω,10Ω±10%, for impedance ≥10Ω
Measurement Display Range L, LK 0.00001µH~9999.99H
C 0.001pF~999.999mF
Q, D 0.00001~99999
Z, X, R 0.0001Ω~999.999MΩ
Y 0.01nS~99.9999S
θ -90.00°~ +90.00° 
DCR 0.01mΩ~99.999MΩ 
Turn,Ratio 0.01~99999.99 turns (Secondary voltage less than 100 Vrms)
Ratio (dB) -39.99dB~+99.99dB (secondary voltage less than 100 Vrms)
Pin-Short 11 pairs, between pin to pin 
Basic Accuracy L, LK, C, Z, X, Y, R, DCR ±0.1% (1kHz if AC parameter)
DCR ±0.5%
θ ±0.04°(1kHz)
Turn, Ratio (dB) ±0.5% (1kHz)
Measurement Speed (Fast) L, LK, C, Z, X, Y, R, Q, D,θ 80 meas./sec.
DCR 50 meas./sec.
Turn, Ratio (dB) 10 meas./sec.
Judge Transformer Scanning PASS/FAIL judge of all test parameters output from Handler interface, 100 bin sorting for Lk
LCR METER - 10 bins for sorting & bin sum count output from Handler interface/PASS/FAIL judge output from Handler interface 
Memory 15 instrument setups, expansion is possible via memory card
Trigger Internal, Manual, External
Display 320x240 dot-matrix LCD display
Equivalent Circuit Mode Series, Parallel
Correction Function Open/Short Zeroing, Load correction

Options

Options Descriptions
Hardware Options 3250 Automatic Transformer Test System
3250 Automatic Transformer Test System with 8mA Bias
3252 Automatic Component Analyzer 
3252 Automatic Component Analyzer with GPIB interface
3302 Automatic Component Analyzer
3302 Automatic Component Analyzer with GPIB interface
3302 Automatic Component Analyzer with 8mA Bias
3302 Automatic Component Analyzer without Transformer Scan
A110104 SMD Test Cable #17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110234 High Frequency Test Cable
A110236 19" Rack Mounting Kit
A110239 4 Terminals SMD Electrical Capacitor Test Box (Patent)
A113012 Vacuum Generator for A132574
A113014 Vacuum Pump for A132574
A132501 Auto Transformer Scanning Box (3001A)
A132563 WINCPK Transformer Data Statistics & Analysis Software for USB port
A132574 Test Fixture for SMD power choke
A133004 SMD Test Box
A133006 1A Internal Bias Current Source
A133019 BNC Test Lead, 2M (single side open)


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3312


Chroma 3312 Telecom Transformer Test System
Chroma 3312 Telecom Transformer Test System

The Chroma 3312 Telecom Transformer Test System is a precision test system, designed for telecom transformer production line or incoming/ outgoing inspection in quality control process, with high stability and high reliability.

The 3312 provides 20Hz-1MHz test frequencies. In addition to transformer scanning test function, the 3312 has LCR Meter function. In test items, The 3312 covers most of telecom transformer's low-voltage test parameters which include telecom test parameters as Return Loss (RLOS), Reflected Impedance (Zr), Insertion Loss (ILOS), Frequency response (FR), and Longitudinal Balance (LBAL) etc.; primary test parameters of general transformer as Inductance, Leakage Inductance, Turns -Ratio, DC resistance, Impedance, and Capacitance (between windings) etc.; secondary test parameters of general transformer as Quality Factor and ESR etc.; and pin-short test function. High-speed digital sampling measurement technology combined with scanning test fixture (A132501) design, improve low-efficiency telecom transformer inspection to be more accurate and faster.

The 3312 even provides several output impedance selection to solve inductance measurement error problem caused by different test current caused by different output impedance provided by different LCR Meters.

Key Features

  • Includes most test items in telecommunication transformer inspection
  • Programmable frequency : 20Hz~1MHz, 0.02% accuracy
  • Basic accuracy : 0.1%
  • 3 different output impedance modes, measurement results are compatible with other well-known LCR meters
  • Enhanced Turn Ratio measurement accuracy for low permeability core
  • ast Inductance/ Turn Ratio measurement speed up to 80 meas./sec
  • Fast DCR measurement speed up to 50 meas./sec
  • 1320 Bias Current Source directly control capability
  • 320x240 dot-matrix LCD display
  • Support versatile standard and custom-design test jigs
  • Four-terminal test for accurate, stable DCR, inductance and turn ratio measurements
  • Built-in comparator; 10 bin sorting with counter capability
  • 4M SRAM memory card, for setup back-up between units
  • Standard RS-232, Handler and Printer interface, option GPIB Interface for LCR function only
  • 15 internal instrument setups for store/recall capability

Basic Performance

Parameters / Characteristics Specifications
3312
Test Signal Test Frequency 20Hz~1MHz, 0.02% accuracy
Basic Accuracy 0.1%
Inductance/ Turn Ratio Measurement Speed  80meas./sec
DCR Measurement Speed  50meas./sec
Display  320x240 dot-matrix LCD display

Options

Options Descriptions
Hardware Options 3312 Telecom Transformer Test System
A110104 SMD Test Cable #17
A110211 Component Test Fixture
A110212 Component Remote Test Fixture
A110234 High Frequency Test Cable
A110239 4 Terminals SMD Electrical Capacitor Test Box (Patent)
A132501 Auto Transformer Scanning Box
A133004 SMD Test Box
A133006 1A Internal Bias Current Source


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1310/1320/1320S/1320-10A


Chroma 13x0 Bias Current Source
Chroma 13x0 Bias Current Source
13x0

The 1320 Bias Current Source output can be controlled by LCR Meter Model 3302/3252/11022/ 11025 directly. The 1320S connected externally can output current up to 100A. The bias current scan frequency triggered automatically or manually can analyze the iron core characteristics in inductor for quality inspection and product feature analysis. They are the best measurement instruments combination for inductor test.

Key Features

Model 1310

  • Frequency response : 20Hz~200kHz
  • 0.001A~10.00A, 90W output capability
  • Forward / Reverse current switching capability
  • Bias current sweep (2~11points), automatic or manual trigger, for core characteristics analysis
  • 16x2 LCD text display
  • 0.001Ω~199.99Ω DCR measurement capability
  • Long term continued maximum power output capability
  • Excellent protection circuit, keep L Meter from damage as bias current was broken abnormally
  • Standard GPIB, Handler interface
  • Bias current sweep (2~21points), automatic or manual trigger, for core characteristics analysis
  • Direct controlled by LCR Meter 3302/3252/ 11022/11025
  • 16x2 LCD text display
  • 0.01mΩ~199.99Ω DCR measurement capability
  • 50 internal instruments setups for store/recall capability
  • Single bias current output timer capability (24 hours)
  • Long term continued maximum power output capability
  • Excellent protection circuit, keep L Meter from damage as bias current was broken abnormally

Model 1320

  • Frequency response : 20Hz~1MHz
  • 0.001A~20.00A, 150W output capability, maximum 100Adc extendable with 1320S
  • Forward / Reverse current switching capability
  • Standard GPIB, Handler interface
  • Bias current sweep (2~21points), automatic or manual trigger, for core characteristics analysis
  • Direct controlled by LCR Meter 3302/3252/11022/11025
  • 16x2 LCD text display
  • 0.01mΩ~199.99Ω DCR measurement capability
  • 50 internal instruments setups for store/recall capability
  • Single bias current output timer capability (24 hours)
  • Long term continued maximum power output capability
  • Excellent protection circuit, keep L Meter from damage as bias current was broken abnormally

Basic Performance

Parameters / Characteristics Specifications
1310 1320
Frequency Response 20Hz~200kHz 20Hz~1MHz
Output Capability 0.001A~10.00A, 90W output capability 0.001A~20.00A, 150W output capability, maximum 100Adc extendable with 1320S
DCR measurement capability 0.001Ω~199.99Ω

Options

Options Descriptions
Hardware Options 1310 Bias Current Source 0-10A
1320 Bias Current Source 0-20A
1320-10A Bias Current Source 0-10A
1320S Bias Current Source (Slave)
A113011 4 Terminals Test Cable with Clip
A115001 Foot Switch #10


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11300


Chroma 11300 Bias Current Test System
Chroma 11300 Bias Current Test System
mg3740a_max_power

Chroma 11300 bias current test system is an integration test system of LCR Meter and Bias Current Source.

It consists of Chroma 3252/3302 series Automatic Component Analyzer and Chroma 1320 series Bias Current Source. The Chroma 1320 series bias current source output can be controlled by Chroma 3252/3302 LCR meter directly. The bias current output capacity can be selected up to 100A to satisfy various testing in R&D, QC, QA, and production applications.

This system is designed for large DC current testing, up to 300A. The connector between bias current sources is low ESR (This system provides power choke characteristic sweep graph analysis through Windows® base software or sweep function of the meter. The bias current scan triggered automatically or manually can analyze the iron core characteristics in inductor for quality inspection and product feature analysis. The Chroma 11300 is a just right test solution for magnetic choke and core used in various power supply.


power_meas

Key Features

  • High efficiency, forward / reverse current switching capability and sweep function
  • High stability, frequency response from 20Hz to 1MHz
  • High accuracy, 3% output current accuracy
  • Expansion capabilities, up to 100A
  • Vertical design, easy to maintain
  • Flexible modular test system
  • Multi-channel intakes in the front panel of rack and multi-fans exhausts in the back of rack
  • Multi-function four terminal test fixture
  • Low ESR (< 10m ohm) design for connecters between bias current sources
  • Windows® based software
  • Up to 300A by customization

Basic Performance

Parameters / Characteristics Specifications
11300
Stability, Frequency Response 20Hz to 1MHz
Output Current Accuracy 3%
Expansion capabilities Up to 100A

Options

Options Descriptions
Hardware Options 11300 Bias Current Test System
A113006 19" Rack 35U for Model 11300
A113007 19" Rack 20U for Model 11300
A113008 Four terminal test fixture for DIP 100A
A113009 Four terminal test fixture for SMD 60A (combined with A113008)
A113010 Four terminal PCB for SMD 100A (combined with A113008)
A113012 Vacuum Generator for A113009
A113014 Vacuum Pump for A113009
LCR-Meter Refer to 3252, 3302
Bias-Stroquelle Refer to 1320, 1320S


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A132501


Chroma a132501 Test Fixture of Auto Transformer Scanning Box
Chroma a132501 Test Fixture of Auto Transformer Scanning Box

Key Features

To Be Updated...



There is no specification for Test Fixture of Auto Transformer Scanning Box Model A132501.


Options

Options Descriptions
Hardware Options A132547 4-4mm Test Fixture
A132572 3.5/4mm Test Fixture
A132573 3.2/3.5mm Test Fixture
A132579 7.5-5mm Test Fixture
A132583 3.0-3.0mm Test Fixture
A132584 3.5-3.5mm Test Fixture
A132585 3.8-3.8mm Test Fixture
A132586 3.0-4.0mm Test Fixture


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11050


Chroma 11050 HF LCR Meter Chroma 11050 HF LCR Meter Chroma 11050 HF LCR Meter
Chroma 11050 HF LCR Meter
Chroma 11050 HF LCR Meter
Chroma 11050 HF LCR Meter

The Chroma 11050 series HF LCR Meter is a precision test instrument designed to accurately measure and evaluate passive components at high speeds. Its measurement capabilities cover the primary and secondary parameters required for testing the inductance, capacitance, resistance, quality factor and loss factor of passive components. The HF LCR Meter has a broad testing frequency range from 75kHz~30MHz/1kHz~10MHz/60Hz~5MHz suitable for analyzing the components' characteristics under different frequencies. Its 0.1% basic measurement accuracy provides stable and highly reliable results. A fast 7ms measurement speed effectively increases productivity when working in an automated environment.

In addition to the excellent measurement features found in other Chroma LCR Meters, the 11050 series includes additional useful functions. It has 3 output impedance modes to satisfy demands of measuring and working with other instruments. The versatile digital display can be configured to best fit the current testing resolution; furthermore, the test signal monitoring function displays the voltage and current that is actually carried to the DUT. The timing settings of trigger delay, measure delay and average number of times allow the measurements to transfer seamlessly to an automated test environment providing accurate results within a limited testing time.

The detached design adopted by the Chroma 11050 series provides several advantages. Since test processing and the display use separate CPUs, the testing speed is increased and shorter test leads are needed when integrated into an automated test environment. Shorter test leads improve the accuracy of high frequency measurements.

Chroma's 11050 series HF LCR Meter has multiple remote interface options. Handler and RS-232C remote interfaces come standard for software or hardware control of test conditions, measurement trigger, judge test results, and collect measured data. The standard USB port saves device settings and controls the output of an external DC bias current source. Optional GPIB and Ethernet remote interfaces are available as well for software control.

Key Features

  • Test Parameter: L/C/R/Z/Y/DCR/Q/D/ θ
  • Test Frequency: 75kHZ~30MHz (11050-30M), 1kHz~10MHz (11050), 60Hz~5MHz (11050-5M)
  • Test Level: 10mV ~ 5V
  • Basic Accuracy: 0.1%
  • 7ms fast speed measurement
  • 3 output impedance modes
  • Test signal monitoring function
  • Compare & bin-sorting function
  • Open/short zeroing & load correction function
  • Detached measurement & display unit design
  • Standard Handler, RS-232C, USB storage & external bias current control interface
  • Optional GPIB or LAN interface

Basic Performance

Parameters / Characteristics Specifications
11050-30M 11050 11050-50M
Test Parameter L, C, R, Z, Y, Q, D, θ L, C, R, Z, Y, DCR, Q, D, θ
Test Signal Test Frequency 75kHz ~ 30MHz
± (0.1% + 0.01Hz)
1kHz ~ 10MHz
± (0.1% + 0.01Hz)
60Hz ~ 5MHz
± (0.1% + 0.01Hz)
Test Level 10mV ~ 1V ; ± [(10 + fm)% + 10mV]
fm: test frequency [MHz]
≤1MHz : 10mV ~ 5V ; ± [(10 + fm)% + 1mV]
>1MHz : 10mV ~ 1V ; ± [(10 + fm)% + 1mV]
fm: test frequency [MHz]
Output Impedance 100Ω, 25Ω 100Ω, 25Ω, OFF
Measurement Display Range L 0.00001uH ~ 99.999MH
C 0.00001pF ~ 999.999F
R, Z 0.01mΩ ~ 9999.99MΩ
DCR -- 0.01mΩ ~ 999.99MΩ
Q, D 0.00001 ~ 99999
θ -90.00° ~ 90.00° 
Basic Accuracy Z ± 1.5% ± 0.1%
θ ± 0.3° ± 0.04°
DCR -- ± 0.1%
Measurement Speed Very Fast : 7ms, Fast : 15ms, Medium : 150ms, Slow : 295ms
Communication Interface RS-232C, Handler, USB storage, External bias current control, GPIB (option), LAN (option)
Measurement Functions Trigger Mode Internal, Manual, External, Bus
Range Switching Mode Auto, Hold
Equivalent Circuit Mode Series, Parallel
Judgment Compare, Bin-sorting
Correction Open/Short Zeroing, Load Correction

Options

Options Descriptions
Hardware Options 11050 HF LCR Meter, 1kHz~10MHz
11050-5M HF LCR Meter, 60Hz~5MHz
11050-30M HF LCR Meter, 75kHz~30MHz
A662013 Test fixture (DIP)
A662014 Test leads (1M)
A662017 4-terminal SMD test fixture
A662018 GPIB & Handler interface
A662019 LAN & USB-H interface
A662021 Extension test lead for automation (BNC to SMA, 1M)


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